I’d like to know if exist the possibility to measure the thickness of the lamellar structure (see the image). The images show an alternating sequence of dark and light lines where the dark regions correspond to the stained electron dense material. We attribute such images as being due to stacks of crystal lamellae where the white bands correspond to thecrystal core, which remains unstained and the dark bands to the disordered or amorphous lamellar surface and interlamellar material. So I’d like to measure the thickness without segmented or freehand line on the image. I’d like to use a procedure that exclude if possible the manual direct mesure on the image (that’s could introduce some error of interpretation). Many thx for your help.